MDS-Rely

Center Publications

Graphics Author(s) Publications
M. Li, M. J. McCourt, A. J. Galante, and P. W. Leu M. Li, M. J. McCourt, A. J. Galante, and P. W. Leu, “Bayesian optimization of nanophotonic electromagnetic shielding with very high visible transparency,” Optics Express, vol. 30, no. 18, pp. 33182-33194, Aug 2022
M. Li, S. Sinha, S. Hannani, S. B. Walker, M. LeMieux, and P. W. Leu M. Li, S. Sinha, S. Hannani, S. B. Walker, M. LeMieux, and P. W. Leu, “Ink-Coated Silver Films on PET for Flexible, High Performance Electromagnetic Interference Shielding and Joule Heating,” ACS Applied Electronic Materials, vol. 5, no. 1, Jan 2023
M. Li, M. Zarei, A. J. Galante, B. Pilsbury, S. Brett Walker, M. LemieuX, and P. W. Leu M. Li, M. Zarei, A. J. Galante, B. Pilsbury, S. Brett Walker, M. LemieuX, and P. W. Leu, “Stretchable and wash durable reactive silver ink coatings for electromagnetic interference shielding, Joule heating, and strain sensing textiles,” Progress in Organic Coatings, vol. 179, p. 107506, Jun. 2023.
M. Li, M. Zarei, K. Mohammadi, S. B. Walker, M. LeMieux, and P. W. Leu M. Li, M. Zarei, K. Mohammadi, S. B. Walker, M. LeMieux, and P. W. Leu, “Silver Meshes for Record-Performance Transparent Electromagnetic Interference Shielding,” ACS Appl. Mater. Interfaces, vol. 15, no. 25, p. 20591-30599, Jun. 2023, doi: 10.1021/acsami.3c02088
Silver nanoparticle ink. Top row shows original bright field SEM with STEM3+ detector images from 2-10 weeks while corresponding bottom image shows the WEKA segmentation results.
Sylvie F. Crowell, Mitchell Melander, and Janet L. Gbur Sylvie F. Crowell, Mitchell Melander, and Janet L. Gbur, Determining Morphology and Size Distribution of Nano-scale Features in Conductive Ink for use in Aerosol Jet Printing,” Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, pp. 194–195
Zhang, H., Prasad Vallabh, C.K., and Zhao, X. Zhang, H., Prasad Vallabh, C.K., and Zhao, X., “Machine learning enhanced high dynamic range fringe projection profilometry for in-situ layer-wise surface topography measurement during LPBF additive manufacturing,” Precision Engineering, vol. 84, pp. 1-14, Nov. 2023, doi: 10.1016/j.precisioneng.2023.06.015